[hpc-announce] CFP Deadline Extension Extension: Resilience at Euro-Par 2018 - Papers due May 15

[Christian Engelmann]

We apologize if you receive multiple copies of this call for papers.
The workshop paper deadline has been extended further to May 15, 2018 (no further extensions).

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11th Workshop on Resiliency in High Performance Computing (Resilience)
                in Clusters, Clouds, and Grids
   <https://www.csm.ornl.gov/srt/conferences/Resilience/2018 <https://www.csm.ornl.gov/srt/conferences/Resilience/2018>>

                     in conjunction with

the 24th International European Conference on Parallel and Distributed
              Computing (Euro-Par), Turin, Italy
                     August 27 - 31, 2018
                  <https://europar2018.org <https://europar2018.org/>>

Overview:

Resilience is a critical challenge as high performance computing (HPC)
systems continue to increase component counts, individual component
reliability decreases (such as due to shrinking process technology and
near-threshold voltage (NTV) operation), and software complexity increases.
Application correctness and execution efficiency, in spite of frequent
faults, errors, and failures, is essential to ensure the success of the
extreme-scale HPC systems, cluster computing environments, Grid computing
infrastructures, and Cloud computing services.

While a fault (e.g., a bug or stuck bit) is the cause of an error, its
manifestation as a state change is considered an error (e.g., a bad value
or incorrect execution), and the transition to an incorrect service is
observed as a failure (e.g., an application abort or system crash). A
failure in a computing system is typically observed through an application
abort or a full/partial service or system outage. A detectable correctable
error is often transparently handled by hardware, such as a single bit flip
in memory that is protected with single-error correction double-error
detection (SECDED) error correcting code (ECC). A detectable uncorrectable
error (DUE) typically results in a failure, such as multiple bit flips in
the same addressable word that escape SECDED ECC correction, but not
detection, and ultimately cause an application abort. An undetectable error
(UE) may result in silent data corruption (SDC), e.g., an incorrect
application output. There are many other types of hardware and software
faults, errors, and failures in computing systems.

Resilience for HPC systems encompasses a wide spectrum of fundamental and
applied research and development, including theoretical foundations, fault
detection and prediction, monitoring and control, end-to-end data integrity,
enabling infrastructure, and resilient solvers and algorithm-based fault
tolerance. This workshop brings together experts in the community to further
research and development in HPC resilience and to facilitate exchanges
across the computational paradigms of extreme-scale HPC, cluster computing,
Grid computing, and Cloud computing.

Submission Guidelines:

Authors are invited to submit papers electronically in English in PDF
format. Submitted manuscripts should be structured as technical papers and
BETWEEN 10 AND 12 PAGES, including figures, tables and references, using
Springer's Lecture Notes in Computer Science (LNCS) format at
<http://www.springer.com/computer/lncs?SGWID=0-164-6-793341-0 <http://www.springer.com/computer/lncs?SGWID=0-164-6-793341-0>>. Papers with
less than 10 or more than 12 pages will not be accepted due to publisher
guidelines. Submissions should include abstract, key words and the e-mail
address of the corresponding author. Papers not conforming to these
guidelines may be returned without review. All manuscripts will be reviewed
and will be judged on correctness, originality, technical strength,
significance, quality of presentation, and interest and relevance to the
conference attendees. Submitted papers must represent original unpublished
research that is not currently under review for any other conference or
journal. Papers not following these guidelines will be rejected without
review and further action may be taken, including (but not limited to)
notifications sent to the heads of the institutions of the authors and
sponsors of the conference. Submissions received after the due date or not
appropriately structured may also not be considered. The proceedings
will be published in Springer's LNCS as post-conference proceedings. At
least one author of an accepted paper must register for and attend the
workshop for inclusion in the proceedings. Authors may contact the workshop
program chairs for more information.

Important websites:

- Resilience 2018 Website: <https://www.csm.ornl.gov/srt/conferences/Resilience/2018 <https://www.csm.ornl.gov/srt/conferences/Resilience/2018>>
- Resilience 2018 Submissions: <https://easychair.org/conferences/?conf=europar2018ws <https://easychair.org/conferences/?conf=europar2018ws>>
- Euro-Par 2018 website: <https://europar2018.org <https://europar2018.org/>>

Topics of interest include, but are not limited to:

- Theoretical foundations for resilience:
- Metrics and measurement
- Statistics and optimization
- Simulation and emulation
- Formal methods
- Efficiency modeling and uncertainty quantification

- Fault detection and prediction:
- Statistical analyses
- Machine learning
- Anomaly detection
- Data and information collection
- Visualization

- Monitoring and control for resilience:
- Platform and application monitoring
- Response and recovery
- RAS theory and performability
- Application and platform knobs
- Tunable fidelity and quality of service

- End-to-end data integrity:
- Fault tolerant design
- Degraded modes
- Forward migration and verification
- Fault injection
- Soft errors
- Silent data corruption

- Enabling infrastructure for resilience:
- RAS systems
- System software and middleware
- Programming models
- Tools
- Next-generation architectures

- Resilient solvers and algorithm-based fault tolerance:
- Algorithmic detection and correction of hard and soft faults
- Resilient algorithms
- Fault tolerant numerical methods
- Robust iterative algorithms
- Scalability of resilient solvers and algorithm-based fault tolerance

Important Dates:

- Workshop papers due: May 15, 2018 (no further extensions)
- Workshop author notification: June 15, 2018
- Workshop early registration: TBD
- Workshop paper (for informal workshop proceedings): July 6, 2018
- Workshop date: August 27-28, 2018
- Workshop camera-ready papers: October 2, 2018

General Co-Chairs:

- Stephen L. Scott
Senior Research Scientist - Systems Research Team
Tennessee Tech University and Oak Ridge National Laboratory, USA
scottsl at ornl.gov <mailto:scottsl at ornl.gov>
- Chokchai (Box) Leangsuksun,
SWEPCO Endowed Associate Professor of Computer Science
Louisiana Tech University, USA
box at latech.edu <mailto:box at latech.edu>

Program Co-Chairs:

- Patrick G. Bridges
University of New Mexico, USA
bridges at cs.unm.edu <mailto:bridges at cs.unm.edu>
- Christian Engelmann
Oak Ridge National Laboratory , USA
engelmannc at ornl.gov <mailto:engelmannc at ornl.gov>

Program Committee:

- Ferrol Aderholdt, Oak Ridge National Laboratory, USA
- Rizwan Ashraf, Oak Ridge National Laboratory, USA
- Wesley Bland, Intel Corporation, USA
- Hans-Joachim Bungartz, Technical University of Munich, Germany
- Marc Casas, Barcelona Supercomputer Center, Spain
- Zizhong Chen, University of California at Riverside, USA
- Robert Clay, Sandia National Laboratories, USA
- Miguel Correia, Universidade de Lisboa, Portugal
- Nathan DeBardeleben, Los Alamos National Laboratory, USA
- James Elliott, Sandia National Laboratories, USA
- Kurt Ferreira, Sandia National Laboratories, USA
- Saurabh Hukerikar, NVIDIA, USA
- Dieter Kranzlmueller, Ludwig-Maximilians University of Munich, Germany
- Ignacio Laguna, Lawrence Livermore National Laboratory, USA
- Scott Levy, University of New Mexico, USA
- Dirk Pflueger, University of Stuttgart, Germany
- Alexander Reinefeld, Zuse Institute Berlin, Germany
- Rolf Riesen, Intel Corporation, USA
- Yves Robert, ENS Lyon, France
- Thomas Ropars, Universite Grenoble Alpes, France
- Martin Schulz, Technical University of Munich, Germany
- Keita Teranishi, Sandia National Laboratories, USA
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