[hpc-announce] CALL FOR PARTICIPATION: 6th Annual IEEE CPMT Soft Error Workshop @ Cisco Systems

Guan, Qiang qguan at lanl.gov
Mon Aug 25 17:11:28 CDT 2014

6th Annual IEEE CPMT Santa Clara Valley
Soft Error Rate (SER) Workshop

October 16 2014 (Thursday)

Building 15, Campus of Cisco Systems, Inc.
Sunken Treasures Conference Room

3750 Cisco Way, San Jose (Map<http://goo.gl/maps/mVZ3n>)

Sponsored by
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Also sponsored by

About the SER Workshop
(Event Website<https://sites.google.com/site/ieeescvserworkshop/>)

For the past 5 years, the annual IEEE Santa Clara valley (SCV) Soft Error Rate (SER) workshop has provided a forum for the exchange of innovative ideas and results on soft error related subjects.

With our unique offering of simultaneous in-room and remote participation, we have provided opportunities for publication and interactive discussion on a variety of critical subjects on SER for an ever-increasing international audience.

As always, there are many reasons to attend this year’s event:

•       Keynote and tutorial talks from leading industry experts

•       New development and results in the area of soft error detection and mitigation

•       Alpha emission measurements techniques

•       Equipment demonstrations

•       Meeting and interacting with other technologists and researchers

•       Flexible access – attend in room or remote via WebEx

•       Free of cost

Submit Abstracts

Deadline for abstract is September 19. Abstracts can be submitted on this page<https://sites.google.com/site/ieeescvserworkshop/submit-abstract>. Previously unpublished work and results are highly encouraged. Published work will also be accepted at the organization committee’s discretion.

Topics of interest include, but are not limited to:

•       Advanced silicon nodes and device SER performance assessment

   •    Impact of SER on high reliability applications including automotive, medical, aeronautical, and networking

•       Success stories of alpha emission or soft error control

•       Wafer and assembly process control and monitor

•       Techniques and approaches for alpha emissivity measurement

Each talk is limited to 15 minutes, with additional 5 minutes for questions. The final presentation will be required 1 week before the event and will be made available for download after the event.

For complete details of the event, visiting the event website<https://sites.google.com/site/ieeescvserworkshop/Call-for-Abstract>.

Register to Attend

Registration for the event is FREE. Both on-site and remote attendance (via WebEx) will be available. For on-site attendees a light lunch will also be provided.

Open the attachment to add the event to Outlook calendars.

Registration website will be set up shortly. Please check the event website<https://sites.google.com/site/ieeescvserworkshop/> for further updates.

Past Presentations

Presentations from past events can be replayed via WebEx or downloaded free of charge on the event website here<https://sites.google.com/site/ieeescvserworkshop/Presentations>.

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